Comparative analysis of electrical properties of single and multilayers of VOx deposited by RF magnetron sputtering for bolometers application

<p></p><p>ABSTRACT VOX thin films (single and multilayers) were fabricated by RF magnetron sputtering for application in bolometers. The samples were deposited without vacuum break from three targets: V2O3; VO2 and V2O5. A RF magnetron sputtering system with three cathodes was built to carry out the depositions. The results showed that both configurations, single layers and multilayers, presented similar values of TCR, roughly 2%/K, and sheet resistance less than 20 kΩ/sq, being recommended for application in bolometers.</p><p></p>